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DFT   2007 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Wall of Fame | Most Viewed DFT-2007 Paper
DFT
2007
IEEE
152views VLSI» more  DFT 2007»
13 years 9 months ago
TMR and Partial Dynamic Reconfiguration to mitigate SEU faults in FPGAs
This paper presents the adoption of the Triple Modular Redundancy coupled with the Partial Dynamic Reconfiguration of Field Programmable Gate Arrays to mitigate the effects of Sof...
Cristiana Bolchini, Antonio Miele, Marco D. Santam...
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