DFT   2007 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
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TMR and Partial Dynamic Reconfiguration to mitigate SEU faults in FPGAs
This paper presents the adoption of the Triple Modular Redundancy coupled with the Partial Dynamic Reconfiguration of Field Programmable Gate Arrays to mitigate the effects of Sof...
Cristiana Bolchini, Antonio Miele, Marco D. Santam...
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