7 search results - page 2 / 2 » NBTI Degradation: A Problem or a Scare |
ISQED
2009
IEEE
14 years 25 days ago
2009
IEEE
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
DATE
2009
IEEE
14 years 23 days ago
2009
IEEE
Abstract—Reliable and verifiable hardware, software and content usage metering (HSCM) are of primary importance for wide segments of e-commerce including intellectual property a...