Sciweavers

11 search results - page 1 / 3
» OPTICS-OF: Identifying Local Outliers
Sort
View
SIGMOD
2000
ACM
137views Database» more  SIGMOD 2000»
13 years 9 months ago
LOF: Identifying Density-Based Local Outliers
For many KDD applications, such as detecting criminal activities in E-commerce, finding the rare instances or the outliers, can be more interesting than finding the common pattern...
Markus M. Breunig, Hans-Peter Kriegel, Raymond T. ...
PKDD
1999
Springer
130views Data Mining» more  PKDD 1999»
13 years 9 months ago
OPTICS-OF: Identifying Local Outliers
: For many KDD applications finding the outliers, i.e. the rare events, is more interesting and useful than finding the common cases, e.g. detecting criminal activities in E-commer...
Markus M. Breunig, Hans-Peter Kriegel, Raymond T. ...
KAIS
2006
77views more  KAIS 2006»
13 years 5 months ago
Finding centric local outliers in categorical/numerical spaces
Outlier detection techniques are widely used in many applications such as credit card fraud detection, monitoring criminal activities in electronic commerce, etc. These application...
Jeffrey Xu Yu, Weining Qian, Hongjun Lu, Aoying Zh...
INFOCOM
2010
IEEE
13 years 3 months ago
Beyond Triangle Inequality: Sifting Noisy and Outlier Distance Measurements for Localization
—Knowing accurate positions of nodes in wireless ad-hoc and sensor networks is essential for a wide range of pervasive and mobile applications. However, errors are inevitable in ...
Lirong Jian, Zheng Yang, Yunhao Liu
DFT
2002
IEEE
115views VLSI» more  DFT 2002»
13 years 10 months ago
Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
Sagar S. Sabade, D. M. H. Walker