A model-based approach for minimization of test sets for interactive systems is introduced. Test cases are efficiently generated and selected to cover the behavioral model and the ...
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
—Many built-in self-testing (BIST) schemes compress the test responses from a k-output circuit to q signature streams, where q << k, a process termed space compaction. The ...
Krishnendu Chakrabarty, Brian T. Murray, John P. H...
We extend the classical algorithms of Valiant and Haussler for learning compact conjunctions and disjunctions of Boolean attributes to allow features that are constructed from the...