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» On Compacting Test Response Data Containing Unknown Values
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VTS
2003
IEEE
104views Hardware» more  VTS 2003»
13 years 10 months ago
Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detectio...
Janak H. Patel, Steven S. Lumetta, Sudhakar M. Red...
DAC
2006
ACM
14 years 6 months ago
Unknown-tolerance analysis and test-quality control for test response compaction using space compactors
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon W...
FASE
2008
Springer
13 years 7 months ago
Regular Inference for State Machines Using Domains with Equality Tests
Abstract. Existing algorithms for regular inference (aka automata learning) allows to infer a finite state machine by observing the output that the machine produces in response to ...
Therese Berg, Bengt Jonsson, Harald Raffelt
BMCBI
2006
124views more  BMCBI 2006»
13 years 5 months ago
Network-based de-noising improves prediction from microarray data
Background: Prediction of human cell response to anti-cancer drugs (compounds) from microarray data is a challenging problem, due to the noise properties of microarrays as well as...
Tsuyoshi Kato, Yukio Murata, Koh Miura, Kiyoshi As...
SAC
2002
ACM
13 years 4 months ago
Choice of wavelet smoothness, primary resolution and threshold in wavelet shrinkage
This article introduces a fast cross-validation algorithm that performs wavelet shrinkage on data sets of arbitrary size and irregular design and also simultaneously selects good ...
Guy P. Nason