53 search results - page 11 / 11 » On Minimization of Peak Power for Scan Circuit during Test |
DDECS
2007
IEEE
14 years 9 days ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
VLSID
2006
IEEE
13 years 12 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
DATE
2006
IEEE
14 years 1 days ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...