27 search results - page 5 / 6 » On Optimizing Scan Testing Power and Routing Cost in Scan Ch... |
MICCAI
2006
Springer
14 years 6 months ago
2006
Springer
Although magnetic resonance imaging is considered to be non-invasive, there is at least one effect on the patient which has to be monitored: The heating which is generated by absor...
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
DAC
2003
ACM
14 years 6 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...