ITC 1999 - PDF Preprint Papers

ITC 1999 International Test Conference

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ITC
1999
IEEE

178views Hardware» more ITC 1999»

Embedded X86 testing methodology

13 years 9 months ago

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The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...

Luis Basto, Asif Khan, Pete Hodakievic

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Id	Views	Title	Status

1	178	Embedded X86 testing methodology	claim
2	118	Logic BIST for large industrial designs: real issues and case studies	claim
3	107	A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming	claim
4	105	Finite state machine synthesis with concurrent error detection	claim
5	103	Delay testing of SOI circuits: Challenges with the history effect	claim
6	103	Resistive bridge fault modeling, simulation and test generation	claim
7	98	A design diversity metric and reliability analysis for redundant systems	claim
8	98	Addressable test ports an approach to testing embedded cores	claim
9	89	Defect detection using power supply transient signal analysis	claim
10	82	Testing a system-on-a-chip with embedded microprocessor	claim
11	78	Minimized power consumption for scan-based BIST	claim
12	73	Fault diagnosis in scan-based BIST using both time and space information	claim
13	67	Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment	claim
14	66	High-level ATPG for Early Power Analysis	claim
15	66	Robust testability of primitive faults using test points	claim
16	59	Static component interconnection test technology in practice	claim

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