27 search results - page 6 / 6 » On Optimizing Scan Testing Power and Routing Cost in Scan Ch... |
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...
ICCV
2005
IEEE
2005
IEEE
Mutual Information-Based 3D Surface Matching with Applications to Face Recognition and Brain Mapping
13 years 10 months ago
Face recognition and many medical imaging applications require the computation of dense correspondence vector fields that match one surface with another. In brain imaging, surfac...