82 search results - page 3 / 17 » On Structural vs. Functional Testing for Delay Faults |
IOLTS
2000
IEEE
13 years 10 months ago
2000
IEEE
We propose a procedure for self-testing of an FPGA programmed to implement a user-defined function. The procedure is intended to improve the detectability of FPGA delay faults. Th...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
TODAES
1998
13 years 5 months ago
1998
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...