36 search results - page 7 / 8 » On Testing the Path Delay Faults of a Microprocessor Using i... |
ISCAS
2008
IEEE
13 years 11 months ago
2008
IEEE
—Software-based self-test (SBST) is a promising new technology for at-speed testing of embedded processors in SoC systems. This paper introduces an effective and efficient new ho...
ICCAD
2004
IEEE
14 years 1 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
TON
2012
11 years 7 months ago
2012
Abstract—Wireless networks (including wireless mesh networks) provide opportunities for using multiple paths. Multihoming of hosts, possibly using different technologies and prov...
TELSYS
2002
13 years 4 months ago
2002
Native multicast routing protocols have been built and deployed using two basic types of trees: singlesource, shortest-path trees and shared, core-based trees. Core-based multicas...
EMSOFT
2005
Springer
13 years 10 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...