23 search results - page 4 / 5 » On applying non-classical defect models to automated diagnos... |
IEAAIE
1999
Springer
13 years 10 months ago
1999
Springer
This paper introduces a new approach in the debugging of hardware designs. The design is given as a VHDL program and converted in a component connection model. The conversion is si...
ICST
2009
IEEE
14 years 24 days ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
ASIAMS
2008
IEEE
13 years 6 months ago
2008
IEEE
Image difference operation is frequently used in automated printed circuit board (PCB) inspection system as well as in many other image processing applications. During the impleme...
AAAI
2011
12 years 6 months ago
2011
Information about the spread of crop disease is vital in developing countries, and as a result the governments of such countries devote scarce resources to gathering such data. Un...
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...