42 search results - page 9 / 9 » On primitive fault test generation in non-scan sequential ci... |
ICCAD
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
VTS
1999
IEEE
13 years 10 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...