5 search results - page 1 / 1 » On the Over-Specification Problem in Sequential ATPG Algorit... |
DAC
1992
ACM
13 years 10 months ago
1992
ACM
JAIR
2010
13 years 4 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
DATE
1997
IEEE
13 years 10 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
MEMOCODE
2007
IEEE
14 years 1 days ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
VLSID
2002
IEEE
14 years 6 months ago
2002
IEEE
Power gating is emerging as a viable solution to reduction of leakage current. However, power gated circuits are different from the conventional designs in the sense that a power-...