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» On the Relaxation of n-detect Test Sets
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DATE
2005
IEEE
99views Hardware» more  DATE 2005»
13 years 11 months ago
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
Irith Pomeranz, Sudhakar M. Reddy
DATE
2006
IEEE
89views Hardware» more  DATE 2006»
13 years 11 months ago
Generation of broadside transition fault test sets that detect four-way bridging faults
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
Irith Pomeranz, Sudhakar M. Reddy
ICCD
2003
IEEE
130views Hardware» more  ICCD 2003»
14 years 2 months ago
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Cha...
VTS
2008
IEEE
81views Hardware» more  VTS 2008»
13 years 11 months ago
On the Relaxation of n-detect Test Sets
Stelios Neophytou, Maria K. Michael
OL
2011
177views Neural Networks» more  OL 2011»
12 years 8 months ago
Exploiting vector space properties to strengthen the relaxation of bilinear programs arising in the global optimization of proce
In this paper we present a methodology for finding tight convex relaxations for a special set of quadratic constraints given by bilinear and linear terms that frequently arise in ...
Juan P. Ruiz, Ignacio E. Grossmann