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» On the Size and Generation of Minimal N-Detection Tests
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DATE
2005
IEEE
99views Hardware» more  DATE 2005»
13 years 11 months ago
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
Irith Pomeranz, Sudhakar M. Reddy
VLSID
2006
IEEE
94views VLSI» more  VLSID 2006»
13 years 11 months ago
On the Size and Generation of Minimal N-Detection Tests
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
Kalyana R. Kantipudi
ECAI
2008
Springer
13 years 7 months ago
Test Generation for Model-Based Diagnosis
This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framewo...
Gregory M. Provan
DAC
2004
ACM
13 years 9 months ago
On test generation for transition faults with minimized peak power dissipation
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
Wei Li, Sudhakar M. Reddy, Irith Pomeranz
KBSE
2005
IEEE
13 years 11 months ago
An analysis of rule coverage as a criterion in generating minimal test suites for grammar-based software
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
Mark Hennessy, James F. Power