12 search results - page 3 / 3 » On the complexity of real root isolation using continued fra... |
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
JPDC
2000
13 years 4 months ago
2000
: SIMD arrays are likely to become increasingly important as coprocessors in domain specific systems as architects continue to leverage RAM technology in their design. The problem ...