Sciweavers

4 search results - page 1 / 1
» Pattern Sensitive Placement Perturbation for Manufacturabili...
Sort
View
TVLSI
2010
12 years 11 months ago
Pattern Sensitive Placement Perturbation for Manufacturability
The gap between VLSI technology and fabrication technology leads to strong refractive effects in lithography. Consequently, it is a huge challenge to reliably print layout features...
Shiyan Hu, Patrik Shah, Jiang Hu
ISPD
2007
ACM
151views Hardware» more  ISPD 2007»
13 years 6 months ago
Pattern sensitive placement for manufacturability
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Shiyan Hu, Jiang Hu
ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
13 years 2 months ago
Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Mohit Gupta, Kwangok Jeong, Andrew B. Kahng
ICCAD
2008
IEEE
129views Hardware» more  ICCAD 2008»
14 years 1 months ago
A capacitance solver for incremental variation-aware extraction
Abstract—Lithographic limitations and manufacturing uncertainties are resulting in fabricated shapes on wafer that are topologically equivalent, but geometrically different from ...
Tarek A. El-Moselhy, Ibrahim M. Elfadel, Luca Dani...