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search results - page 3 / 152
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Pattern-Constrained Test Case Generation
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MEMICS
2010
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Theoretical Computer Science
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Test-Case Generation for Embedded Binary Code Using Abstract Interpretation
13 years 15 days ago
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interpretation example conclusion Test-Case Generation for Embedded Binary ng Abstract Interpretation Thomas Reinbacher1 , J
Thomas Reinbacher, Jörg Brauer, Martin Horaue...
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NFM
2011
366
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Formal Methods
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NFM 2011
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Automated Test Case Generation with SMT-Solving and Abstract Interpretation
13 years 21 days ago
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www.informatik.uni-bremen.de
Jan Peleska, Elena Vorobev, Florian Lapschies
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ICST
2010
IEEE
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Software Engineering
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Verified Firewall Policy Transformations for Test Case Generation
13 years 3 months ago
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www.infsec.ethz.ch
Achim D. Brucker, Lukas Brügger, Paul Kearney...
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ICST
2010
IEEE
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Software Engineering
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Generating Transition Probabilities for Automatic Model-Based Test Generation
13 years 4 months ago
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www.lri.fr
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
Abderrahmane Feliachi, Hélène Le Gue...
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ICSE
2009
IEEE-ACM
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Software Engineering
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ICSE 2009
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Experiments on the Test Case Length in Specification Based Test Case Generation
13 years 10 months ago
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ast2009.com
Gordon Fraser, Angelo Gargantini
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