157 search results - page 32 / 32 » Performance area efficiency in chip multiprocessors with mic... |
DAC
2005
ACM
13 years 7 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
JETC
2008
13 years 3 months ago
2008
With aggressive reductions in feature sizes and the integration of multiple functionalities on the same die, bottlenecks due to I/O pin limitations have become a severe issue in to...