16 search results - page 3 / 4 » Perturbation-based Fault Screening |
TCAD
2008
13 years 4 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
INFSOF
2006
13 years 5 months ago
2006
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
AMOST
2005
ACM
13 years 10 months ago
2005
ACM
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...