4 search results - page 1 / 1 » PiCAP: a parallel and incremental capacitance extraction con... |
DAC
2009
ACM
13 years 11 months ago
2009
ACM
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
GLVLSI
2008
IEEE
13 years 11 months ago
2008
IEEE
In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spect...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
— As Double Patterning Technology (DPT) becomes the only solution for 32-nm lithography process, we need to investigate how DPT affects the performance of a chip. In this paper, ...