60 search results - page 1 / 12 » Post-Silicon Debug Using Programmable Logic Cores |
FPT
2005
IEEE
13 years 10 months ago
2005
IEEE
Producing a functionally correct integrated circuit is becoming increasingly difficult. No matter how careful a designer is, there will always be integrated circuits that are fabr...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
GLVLSI
2008
IEEE
13 years 5 months ago
2008
IEEE
Due to the increasing complexity of today's circuits a high degree of automation in the design process is mandatory. The detection of faults and design errors is supported qu...
FPGA
2001
ACM
13 years 9 months ago
2001
ACM
As the complexity of integrated circuits increases, the ability to make post-fabrication changes to fixed ASIC chips will become more and more attractive. This ability can be real...
FPGA
2003
ACM
13 years 10 months ago
2003
ACM
As integrated circuits become more and more complex, the ability to make post-fabrication changes will become more and more attractive. This ability can be realized using programm...