This paper presents a transistor optimization methodology for low-power analog integrated CMOS circuits, relying on the physics-based gm/ID characteristics as a design optimizatio...
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
In this paper, we consider the problem of maximizing the battery life (or duration of service) in battery-powered CMOS circuits. We first show that the battery efficiency (or utili...
Optimizing power consumption at high-level is a critical step towards power-efficient digital system designs. This paper addresses the power management problem by scheduling a giv...