1419 search results - page 1 / 284 » Power Droop Testing |
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ETS
2009
IEEE
13 years 2 months ago
2009
IEEE
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
DAC
2010
ACM
13 years 2 months ago
2010
ACM
Integrating a large number of on-chip voltage regulators holds the promise of solving many power delivery challenges through strong local load regulation and facilitates systemlev...
TVLSI
2008
13 years 4 months ago
2008
Decoupling capacitors are widely used to reduce power supply noise. On-chip decoupling capacitors have traditionally been allocated into the white space available on a die or place...
PATMOS
2005
Springer
13 years 10 months ago
2005
Springer
As the number of metal layers and the frequency of VLSI continue to increase, the voltage droop on both the package and vias is becoming more pronounced. This paper analyzes the nu...