41 search results - page 2 / 9 » Power Supply Noise Analysis Methodology for Deep-Submicron V... |
SBCCI
2003
ACM
13 years 10 months ago
2003
ACM
As we scale down to deep submicron (DSM) technology, noise is becoming a metric of equal importance as power, speed, and area. Smaller feature sizes, low voltage, and high frequen...
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
Dynamic noise analysis is greatly needed in place of traditional static noise analysis due to the ever increasingly stringent design requirement for VLSI chips based on very deep ...
PATMOS
2000
Springer
13 years 8 months ago
2000
Springer
Abstract. Reduction of chip packaging and cooling costs for deep sub-micron SystemOn-Chip (SOC) designs is an emerging issue. We present a simulation-based methodology able to real...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
Abstract-- With technology further scaling into deep submicron era, power supply noise become an important problem. Power supply noise problem is getting worse due to serious IR-dr...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...