7 search results - page 2 / 2 » Power Supply Transient Signal Analysis Under Real Process an... |
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
The power supply transient signal (IDDT) method that we propose for defect detection analyze regional signal variations introduced by defects at a set of power supply pads on the ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
There are some types of faults in analogue and mixed signal circuits which are very difficult to detect using either voltage or current based test methods. However, it is possible...