33 search results - page 5 / 7 » Power calculation and modeling in deep submicron |
ISQED
2011
IEEE
12 years 9 months ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
ISLPED
2004
ACM
13 years 11 months ago
2004
ACM
The principle of adiabatic switching in conventional energyrecovery adiabatic circuit is generally explained in literature with the help of the rudimentary RC circuit driven by a ...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract--Leakage power consumption contributes significantly to the overall power dissipation for systems that are manufactured in advanced deep sub-micron technology. Different f...
DSD
2002
IEEE
13 years 10 months ago
2002
IEEE
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...
VLSID
2004
IEEE
14 years 6 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...