13 search results - page 1 / 3 » Practical Monte-Carlo based timing yield estimation of digit... |
DATE
2010
IEEE
13 years 5 months ago
2010
IEEE
—The advanced sampling and variance reduction techniques as efficient alternatives to the slow crude-MC method have recently been adopted for the analysis of timing yield in dig...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
TCAD
2010
12 years 11 months ago
2010
The Monte-Carlo (MC) technique is a traditional solution for a reliable statistical analysis, and in contrast to probabilistic methods, it can account for any complicate model. How...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents an efficient statistical design methodology that allows simultaneous sizing for performance and optimization for yield and robustness of analog circuits. The s...