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TCAD
2008
114views more  TCAD 2008»
13 years 4 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
SSPR
2010
Springer
13 years 3 months ago
Non-parametric Mixture Models for Clustering
Mixture models have been widely used for data clustering. However, commonly used mixture models are generally of a parametric form (e.g., mixture of Gaussian distributions or GMM),...
Pavan Kumar Mallapragada, Rong Jin, Anil K. Jain
CVPR
2003
IEEE
14 years 6 months ago
Activity Recognition Using the Dynamics of the Configuration of Interacting Objects
Monitoring activities using video data is an important surveillance problem. A special scenario is to learn the pattern of normal activities and detect abnormal events from a very...
Namrata Vaswani, Amit K. Roy Chowdhury, Rama Chell...