In this paper, we propose a technique for leveraging historical field failure records in conjunction with automated static analysis alerts to determine which alerts or sets of ale...
Mark Sherriff, Sarah Smith Heckman, J. Michael Lak...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Background: The impressive increase of novel RNA structures, during the past few years, demands automated methods for structure comparison. While many algorithms handle only small...
Svetlana Kirillova, Silvio C. E. Tosatto, Oliviero...
In mobile robotics, there are often features that, while potentially powerful for improving navigation, prove difficult to profit from as they generalize poorly to novel situations...
Boris Sofman, Ellie Lin, J. Andrew Bagnell, John C...