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ICCAD
2007
IEEE
132views Hardware» more  ICCAD 2007»
14 years 1 months ago
Principle Hessian direction based parameter reduction with process variation
— As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. In this paper, we propose a Principle Hessi...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
VLSI
2007
Springer
13 years 11 months ago
Parametric structure-preserving model order reduction
Abstract—Analysis and verification environments for nextgeneration nano-scale RFIC designs must be able to cope with increasing design complexity and to account for new effects,...
Jorge Fernandez Villena, Wil H. A. Schilders, L. M...
DT
2006
98views more  DT 2006»
13 years 4 months ago
Handling variations and uncertainties
The widely used engineering decisions concerning the performance of technological equipment for process industries are usually deterministic. Since the early 1990s probabilistic m...
Tim Cheng