129 search results - page 1 / 26 » Process Variations and their Impact on Circuit Operation |
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
The statistical variations in electrical parameters, such as transistor gain factors and interconnect resistances, due to variations in the manufacturing process are studied using...
MICRO
2006
IEEE
13 years 10 months ago
2006
IEEE
Design variability due to die-to-die and within-die process variations has the potential to significantly reduce the maximum operating frequency and the effective yield of high-p...
ISLPED
2006
ACM
13 years 10 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Die-to-die and within-die variations impact the frequency and power of fabricated dies, affecting functionality, performance, and revenue. Variation-tolerant circuits and post-sil...