102 search results - page 2 / 21 » Pseudo-Exhaustive Testing of Sequential Circuits |
ICCD
2006
IEEE
13 years 11 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
DAC
1999
ACM
14 years 5 months ago
1999
ACM
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
TCAD
1998
13 years 4 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...