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» Quality of a Bit (QoB): A New Concept in Dependable SRAM
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ISQED
2008
IEEE
151views Hardware» more  ISQED 2008»
13 years 11 months ago
Quality of a Bit (QoB): A New Concept in Dependable SRAM
We propose a novel dependable SRAM with 7T memory cells, and introduce a new concept, “quality of a bit (QoB)” for it. The proposed SRAM has three modes: a typical mode, high-...
Hidehiro Fujiwara, Shunsuke Okumura, Yusuke Iguchi...
VLSID
2009
IEEE
220views VLSI» more  VLSID 2009»
14 years 5 months ago
A 7T/14T Dependable SRAM and its Array Structure to Avoid Half Selection
We propose a novel dependable SRAM with 7T cells and their array structure that avoids a half-selection problem. In addition, we introduce a new concept, "quality of a bit (Q...
Hidehiro Fujiwara, Shunsuke Okumura, Yusuke Iguchi...