7 search results - page 2 / 2 » Random benchmark circuits with controlled attributes |
VLSID
2005
IEEE
13 years 10 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
DAC
2004
ACM
13 years 9 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...