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FPL
2005
Springer
112views Hardware» more  FPL 2005»
13 years 10 months ago
Defect-Tolerant FPGA Switch Block and Connection Block with Fine-Grain Redundancy for Yield Enhancement
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
Anthony J. Yu, Guy G. Lemieux
CORR
1998
Springer
110views Education» more  CORR 1998»
13 years 4 months ago
laboratories for Data Communications and Computer Networks
Abstract In this paper we describe a hands-on laboratory oriented instructional package that we have developed for data communications and networking. The package consists of a sof...
Rohit Goyal, Steve Lai, Raj Jain, Arjan Durresi