23 search results - page 3 / 5 » Reliability challenges for 45nm and beyond |
KAIS
2008
13 years 5 months ago
2008
Much work on skewed, stochastic, high dimensional, and biased datasets usually implicitly solve each problem separately. Recently, we have been approached by Texas Commission on En...
NSDI
2008
13 years 7 months ago
2008
Very few computer systems that have been deployed in rural developing regions manage to stay operationally sustainable over the long term; most systems do not go beyond the pilot ...
DAC
2003
ACM
14 years 6 months ago
2003
ACM
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltag...
DAC
2008
ACM
13 years 7 months ago
2008
ACM
Graphene nanoribbon FETs (GNRFETs) are promising devices for beyond-CMOS nanoelectronics because of their excellent carrier transport properties and potential for large scale proc...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
Microfluidic biochips promise to revolutionize biosensing and clinical diagnostics. As more bioassays are executed concurrently on a biochip, system integration and design complex...