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» Reusable test collections through experimental design
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DATE
2003
IEEE
128views Hardware» more  DATE 2003»
13 years 10 months ago
Virtual Compression through Test Vector Stitching for Scan Based Designs
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
Wenjing Rao, Alex Orailoglu
ALGORITHMICA
2002
83views more  ALGORITHMICA 2002»
13 years 5 months ago
A Tutorial for Designing Flexible Geometric Algorithms
The implementation of an algorithm is faced with the issues efficiency, flexibility, and ease-of-use. In this paper, we suggest a design concept that greatly increases the flexibi...
Vikas Kapoor, Dietmar Kühl, Alexander Wolff
DATE
2009
IEEE
93views Hardware» more  DATE 2009»
14 years 2 days ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
DATE
2002
IEEE
135views Hardware» more  DATE 2002»
13 years 10 months ago
Reducing Test Application Time Through Test Data Mutation Encoding
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
Sherief Reda, Alex Orailoglu
MODELS
2007
Springer
13 years 11 months ago
Using Domain-Specific Modeling to Generate User Interfaces for Wizards
The rising adoption and incorporation of computers into everyday life requires human-computer interaction methods to be efficient and easy to understand. Simultaneously, complexit...
Enis Afgan, Jeffrey G. Gray, Purushotham Bangalore