29 search results - page 1 / 6 » SPIN-TEST: automatic test pattern generation for speed-indep... |
DAC
1997
ACM
13 years 9 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
ICCAD
2004
IEEE
14 years 1 months ago
2004
IEEE
ICTAI
1994
IEEE
13 years 8 months ago
1994
IEEE
ITC
1994
IEEE
13 years 8 months ago
1994
IEEE
EURODAC
1990
IEEE
13 years 9 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...