2 search results - page 1 / 1 » SRAM Retention Testing: Zero Incremental Time Integration wi... |
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...