23 search results - page 3 / 5 » SRAM parametric failure analysis |
DAC
2008
ACM
14 years 6 months ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
CSDA
2010
13 years 5 months ago
2010
A two component parametric mixture is proposed to model survival after an invasive treatment, when patients may experience different hazards regimes: a risk of early mortality dir...
MTDT
2003
IEEE
13 years 11 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
FPCA
1989
13 years 9 months ago
1989
Parametric polymorphism constrains the behavior of pure functional programs in a way that allows the derivation of interesting theorems about them solely from their types, i.e., v...
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...