22 search results - page 5 / 5 » Scalable Test Generators for High-Speed Datapath Circuits |
HIPEAC
2011
Springer
12 years 4 months ago
2011
Springer
In chip multiprocessors (CMPs), data accesslatency dependson the memory hierarchy organization, the on-chip interconnect (NoC), and the running workload. Reducing data access late...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...