13 search results - page 2 / 3 » Scan Power Reduction Through Test Data Transition Frequency ... |
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
BMCBI
2010
13 years 5 months ago
2010
Background: Recent biological discoveries have shown that clustering large datasets is essential for better understanding biology in many areas. Spectral clustering in particular ...
ICPR
2004
IEEE
14 years 6 months ago
2004
IEEE
Feature subset selection, applied as a pre-processing step to machine learning, is valuable in dimensionality reduction, eliminating irrelevant data and improving classifier perfo...