46 search results - page 5 / 10 » Self Testing SoC with Reduced Memory Requirements and Minimi... |
ICCAD
2010
IEEE
13 years 4 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
VTS
2003
IEEE
13 years 11 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
HIPEAC
2007
Springer
14 years 6 days ago
2007
Springer
A critical component in the design of secure processors is memory encryption which provides protection for the privacy of code and data stored in off-chip memory. The overhead of ...
DDECS
2007
IEEE
14 years 11 days ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
DSN
2005
IEEE
13 years 11 months ago
2005
IEEE
The ability to check memory references against their associated array/buffer bounds helps programmers to detect programming errors involving address overruns early on and thus avo...