17 search results - page 2 / 4 » Sequential Circuit Test Generation Using Decision Diagram Mo... |
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
ICCAD
2002
IEEE
14 years 1 months ago
2002
IEEE
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
ICSE
2008
IEEE-ACM
14 years 5 months ago
2008
IEEE-ACM
The Java-UML Lightweight Enumerator (JULE) tool implements a vitally important aspect of the framework for software tool certification - test suite generation. The framework uses ...
TABLEAUX
1998
Springer
13 years 9 months ago
1998
Springer
ple (Extended Abstract) Edmund M. Clarke and Sergey Berezin Carnegie Mellon University -- USA Model checking is an automatic verification technique for finite state concurrent syst...