Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individ...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture-level studies of soft errors since the architecture can mask many raw errors an...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
Smita Krishnaswamy, George F. Viamontes, Igor L. M...
Mounting concerns over variability, defects and noise motivate a new approach for integrated circuits: the design of stochastic logic, that is to say, digital circuitry that opera...
Xin Li, Weikang Qian, Marc D. Riedel, Kia Bazargan...
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...