3 search results - page 1 / 1 » Signal Integrity Loss in SoC's Interconnects: A Diagnosis Ap... |
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
DAC
2002
ACM
14 years 6 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...