27 search results - page 1 / 6 » Simulation and Development of Short Transparent Tests for RA... |
ATS
2001
IEEE
13 years 8 months ago
2001
IEEE
VLSID
2001
IEEE
14 years 5 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
CNSR
2006
IEEE
13 years 11 months ago
2006
IEEE
The deployment of Reconfigurable Optical Add/Drop Multiplexers (ROADMs) is going to change the conventional architecture for metro networks. In this paper, we present detailed fea...
ICDCS
2008
IEEE
13 years 11 months ago
2008
IEEE
The multi-level storage architecture has been widely adopted in servers and data centers. However, while prefetching has been shown as a crucial technique to exploit the sequentia...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...