3 search results - page 1 / 1 » Soft Error Tolerant Asynchronous Circuits Based on Dual Redu... |
DSD
2009
IEEE
14 years 9 days ago
2009
IEEE
DATE
2008
IEEE
14 years 5 hour ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
MICRO
2006
IEEE
13 years 5 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...